ICREA Prof. Jordi Arbiol was born in Molins de Rei (Catalonia) in 1975. Having graduated in physics from the Universitat de Barcelona (UB) in 1997, he went on to obtain his PhD in transmission electron microscopy applied to nanostructured materials from this same university in 2001. He earned the “European Doctorate” label in recognition of the european dimension of his thesis project, as well as an extraordinary doctorate award from UB. He then held the position of assistant professor at the UB, before becoming a group leader at the Institut de Ciència de Materials de Barcelona (ICMAB) in 2009, as well as the scientific supervisor of the institute’s electron microscopy facility. There he began his personal and professional mission to improve Barcelona’s baseline electron microscopy infrastructure, an endeavour he has continued to pursue at the ICN2, which he joined in 2015 as the leader of the Advanced Electron Nanoscopy Group.
He has been President of the Spanish Microscopy Society (SME) (2017-2021), Vice-president (2013-2017) and member of its Executive Board (2009-2021). In 2019 he became a Member of the Executive Board of the International Federation of Societies for Microscopy (IFSM) (2019-2027). He is member of the Research Committee at the Barcelona Institute of Science and Technology (BIST) and Scientific Supervisor of Electron Microscopy at ICN2 and the ALBA Synchrotron EM Centre.
Other recognitions include the FWO Commemorative Medal in 2021, the BIST Ignite Award in 2018, the 2014 EU40 Materials Prize (E-MRS), the 2014 EMS Outstanding Paper Award, as well as being listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist. He currently has more than 410 peer-reviewed publications, h-index 87 GoS (76 WoS), with more than 24,400 GoS (19,000 WoS) citations.